1. An introduction to logic circuit testing /
پدیدآورنده : Parag K. Lala
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Digital electronics-- Testing,Electric fault location,Integrated circuits-- Very large scale integration-- Testing,Logic circuits-- Testing
2. Design, Analysis and Test of Logic Circuits Under Uncertainty
پدیدآورنده : \ Smita Krishnaswamy, Igor L. Markov, John P. Hayes
کتابخانه: Library of Foreign Languages and Islamic Sources (Qom)
موضوع : Logic circuits -- Design,Logic circuits -- Testing,Uncertainty (Information theory),مدارهای منطقی -- طراحی,مدارهای منطقی -- آزمایش,عدم قطعیت (نظریه اطلاعات)
رده :
E-Book
,
3. Design, analysis and test of logic circuits under uncertainty
پدیدآورنده : Smita Krishnaswamy, Igor L. Markov, John P. Hayes
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Logic circuits-- Design,Logic circuits-- Testing,Uncertainty (Information theory)
رده :
TK7868
.
L6
K75
2013
4. Design of testable logic circuits
پدیدآورنده : R.G. Bennetts
کتابخانه: Central Library and Information Center of Shahed University (Tehran)
موضوع : Logic circuits,Logic circuits--Testing
رده :
TK
،
7868
،.
L6
,
B45
،
1984
5. Design of testable logic circuits
پدیدآورنده : Bennetts, R.G.
کتابخانه: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
موضوع : Logic circuits,Logic circuits - Testing
رده :
TK
7868
.
L6
B45
1984
6. Design of testable logic circuits
پدیدآورنده : BENNETTS,R G
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : LOGIC CIRCUITS , LOGIC CIRCUITS-TESTING
رده :
TK
7868
.
L6
B45
1984
7. Design of testable logic circuits
پدیدآورنده : / R.G. Bennetts
کتابخانه: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
موضوع : Logic circuits,Logic circuits - Testing
رده :
TK
7686
.
L6B45
1984
8. Edsign of testable logic circuits
پدیدآورنده : Bennetts, R.G.
کتابخانه: Central Library and Information Center of Birjand University (South Khorasan)
موضوع : ، Logic circuits,، logic circuits - testing
رده :
TK
7686
.
L6
B45
1984
9. Neural models and algorithms for digital testing
پدیدآورنده : Chakradhar, Srimat T.
کتابخانه: Library of Niroo Research Institue (Tehran)
موضوع : ، Logic circuits- Testing,، Automatic checkout equipment,، Digital integrated circuits- Testing- Data processing
10. Neural models and algorithms for digital testing
پدیدآورنده : / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell
کتابخانه: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
موضوع : Logic circuits - Testing,Automatic checkout equipment,Digital integrated circuits - Testing - Data processing
رده :
TK
7868
.
L6C44
1991
11. Reasoning in Boolean networks: logic synthesis and verification using testing techniques
پدیدآورنده : Kunz, Wolfgang
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : ، Integrated circuits-- Very large scale integration-- Testing-- Data processing,، Integrated circuits-- Verification-- Data processing,، Logic design-- Data processing
رده :
TK
7874
.
K866
1997
12. Selected reprints on logic design for testability
پدیدآورنده : Compiled by Constantin C. Timoc
کتابخانه: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
موضوع : Logic circuits - Testing - Addresses, essays, lectures
رده :
TK
7888
.
4
.
S45
1984
13. Sequential logic testing and verification
پدیدآورنده : / by Abhijit Ghosh, Srinivas Devadas, A. Richard Newton,Ghosh
کتابخانه: Central Library and Documents Center of Tehran University (Tehran)
موضوع : Logic circuits -- Testing,Logic design,Computer - aided design
رده :
TK
7868
.
L6G47
1992
14. The board designer's guide to testable logic circuits
پدیدآورنده : Maunder, Colin M., Colin Maunder
کتابخانه: Library and Documentation Center of Kurdistan University (Kurdistan)
موضوع : Testing ، Logic circuits
رده :
TK7868
.
L6
M376
1992
